轻敲模式(TappingModeAFM)-拥有Q-control控制技术;接触模式(ContactModeAFM);定量相位成像模式(PhaseImaging);横向力模式(LateralForceMicroscopy,LFM);磁场力显微技术(MagneticForceMicroscopy,MFM);扫描开尔文显微镜(SKM);力调制(ForceModulation);静电力显微技术(ElectricForceMicroscopy,EFM);表面电势显微术(SurfacePotentialMicroscopy);动态和静态力曲线测试(Force-Distance);力阵列测量(ForceVolumeMeasurement);纳米压痕/划痕(Nanoindenting/Scratching);压电响应模式(PiezoResponseForceMicroscopy,PFMmode)